NanoScan Near-field profiling is a common technique used to analyze small laser beams and other sources such as laser diodes, VCSELs, optical fiber, and/or waveguides. Photon has several near-field profiling instrument to fit a variety of applications.

Near-Field Profilers (NFPs) covering a wide range of wavelengths:

• NFP-980: specifically designed for measurement of 980 nm pump lasers.
• NFP-1550: is designed for use in characterizing sources in the 1300nm-1600nm telecommunications wave-length band.
• NFP-VIS: for visible wavelengths, for the 400-700nm wavelength range.
• NFP-Pyro: For higher power and longer wavelength beams - from 190nm to 20μm is available. Can measure beam powers up to 100W.

• Optional UV Wavelengths below 380nm with an optional UV corrected microscope objective.